Nice price, Great finds - Handla här!

Nice price, Great finds - Handla här!

Fri Frakt över 299kr
Fri Frakt över 299kr
Kundservice
Advances in Optics of Charged Particle Analyzers: Part 1

Advances in Optics of Charged Particle Analyzers: Part 1

2 624 kr

2 624 kr

Tidigare lägsta pris:

2 730 kr

I lager

Ons, 19 mar - tis, 25 mar


Säker betalning

14-dagars öppet köp


Säljs och levereras av

Adlibris


Produktbeskrivning

Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Artikel.nr.

88de4e82-3071-5314-b2f1-f80bea05a8a9

Advances in Optics of Charged Particle Analyzers: Part 1

2 624 kr

2 624 kr

Tidigare lägsta pris:

2 730 kr

I lager

Ons, 19 mar - tis, 25 mar


Säker betalning

14-dagars öppet köp


Säljs och levereras av

Adlibris